1413 search results - page 246 / 283 » Design Patterns Application in UML |
139
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DSD
2010
IEEE
15 years 4 months ago
2010
IEEE
—Periodic on-chip scan-based tests have to be applied to a many-core processor SoC to improve its dependability. An infrastructural IP module has been designed and incorporated i...
146
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KDD
2004
ACM
16 years 4 months ago
2004
ACM
Moments before the launch of every space vehicle, engineering discipline specialists must make a critical go/no-go decision. The cost of a false positive, allowing a launch in spi...
160
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KDD
2002
ACM
16 years 4 months ago
2002
ACM
Technology in the field of digital media generates huge amounts of non-textual information, audio, video, and images, along with more familiar textual information. The potential f...
147
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VLSID
2001
IEEE
16 years 4 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
141
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WABI
2009
Springer
15 years 11 months ago
2009
Springer
Abstract. With Next Generation Sequencers, sequence based transcriptomic or epigenomic assays yield millions of short sequence reads that need to be mapped back on a reference geno...