This paper presents a system-level design methodology for networked embedded systems that exploits existing data-redundancy to increase their reliability. The presented approach n...
The advent of large scale multi-hop wireless networks highlights problems of fault tolerance and scale in distributed system, motivating designs that autonomously recover from tra...
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...
Sorin Cotofana, Alexandre Schmid, Yusuf Leblebici,...
As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...
Andrew DeOrio, Konstantinos Aisopos, Valeria Berta...
Fault tolerance is now a primary design constraint for all major microprocessors. One step in determining a processor’s compliance to its failure rate target is measuring the Ar...