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CODES
2009
IEEE
15 years 6 months ago
Exploiting data-redundancy in reliability-aware networked embedded system design
This paper presents a system-level design methodology for networked embedded systems that exploits existing data-redundancy to increase their reliability. The presented approach n...
Martin Lukasiewycz, Michael Glaß, Jürge...
ICPADS
2006
IEEE
15 years 5 months ago
Fast Convergence in Self-Stabilizing Wireless Networks
The advent of large scale multi-hop wireless networks highlights problems of fault tolerance and scale in distributed system, motivating designs that autonomously recover from tra...
Nathalie Mitton, Eric Fleury, Isabelle Guér...
ASAP
2005
IEEE
165views Hardware» more  ASAP 2005»
15 years 5 months ago
CONAN - A Design Exploration Framework for Reliable Nano-Electronics
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...
Sorin Cotofana, Alexandre Schmid, Yusuf Leblebici,...
DAC
2011
ACM
13 years 11 months ago
DRAIN: distributed recovery architecture for inaccessible nodes in multi-core chips
As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...
Andrew DeOrio, Konstantinos Aisopos, Valeria Berta...
ISCA
2010
IEEE
219views Hardware» more  ISCA 2010»
15 years 4 months ago
Using hardware vulnerability factors to enhance AVF analysis
Fault tolerance is now a primary design constraint for all major microprocessors. One step in determining a processor’s compliance to its failure rate target is measuring the Ar...
Vilas Sridharan, David R. Kaeli