200 search results - page 21 / 40 » Design Time Reliability Analysis of Distributed Fault Tolera... |
DAC
2007
ACM
16 years 20 days ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
108
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SOSP
2007
ACM
15 years 8 months ago
2007
ACM
Researchers have made great strides in improving the fault tolerance of both centralized and replicated systems against arbitrary (Byzantine) faults. However, there are hard limit...
112
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DATE
2010
IEEE
15 years 4 months ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
116
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SIGOPS
2011
14 years 6 months ago
2011
Secure, fault-tolerant distributed systems are difficult to build, to validate, and to operate. Conservative design for such systems dictates that their security and fault toleran...
ALGORITHMICA
2008
14 years 11 months ago
2008
In this paper we investigate the design and analysis of algorithms resilient to memory faults. We focus on algorithms that, despite the corruption of some memory values during the...