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IMC
2003
ACM
15 years 6 months ago
Simple network performance tomography
In network performance tomography, characteristics of the network interior are inferred by correlating end-to-end measurements. In much previous work, the presence of correlations...
Nick G. Duffield
109
Voted
CSMR
1999
IEEE
15 years 5 months ago
Employing Use-cases and Domain Knowledge for Comprehending Resource Usage
Philips Electronics is a world wide electronics company that develops many products containing embedded software. These products range from shavers with only few hundred bytes of ...
René L. Krikhaar, Maarten Pennings, J. Zonn...
VTS
1999
IEEE
66views Hardware» more  VTS 1999»
15 years 5 months ago
A New Bare Die Test Methodology
1 While multichip module technology has been developed for high performance IC applications, the technology is not widely adopted due to economical reasons. One of the reasons that...
Zao Yang, K.-T. Cheng, K. L. Tai
76
Voted
VTS
1998
IEEE
98views Hardware» more  VTS 1998»
15 years 5 months ago
Experimental Results for IDDQ and VLV Testing
An experimental test chip was designed and manufactured to evaluate different test techniques. Based on the results presented in the wafer probe, 309 out of 5491 dies that passed ...
Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu,...
ICCV
2007
IEEE
15 years 4 months ago
Probabilistic Linear Discriminant Analysis for Inferences About Identity
Many current face recognition algorithms perform badly when the lighting or pose of the probe and gallery images differ. In this paper we present a novel algorithm designed for th...
Simon J. D. Prince, James H. Elder