88 search results - page 15 / 18 » Design for manufacturability in submicron domain |
ASAP
2004
IEEE
15 years 3 months ago
2004
IEEE
Decreasing feature sizes allow additional functionality to be added to future microprocessors to improve the performance of important application domains. As a result of rapid gro...
102
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IJCAI
1989
15 years 28 days ago
1989
Solving design and analysis problems in physical worlds requires the representatio n of large amounts of knowledge. Recently, there has been much interest in explicitly making ass...
101
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JGAA
2000
14 years 11 months ago
2000
This paper considers problems of the following type: given an edgeweighted k-colored input graph with maximum color class size c, find a minimum or maximum c-way cut such that eac...
120
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TASE
2010
IEEE
14 years 6 months ago
2010
IEEE
Concurrent engineering (CE) is a methodology applied to product lifecycle development so that high quality, well designed products can be provided at lower prices and in less time....
107
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AEI
2006
14 years 11 months ago
2006
This paper presents a linguistic framework for developing a formal knowledge acquisition method. The framework is intended to empower domain experts to specify information require...