10533 search results - page 104 / 2107 » Design in reliability for communication designs |
SEAL
2010
Springer
14 years 8 months ago
2010
Springer
During engineering design, it is often difficult to quantify product reliability because of insufficient data or information for modeling the uncertainties. In such cases, one need...
DAC
2006
ACM
15 years 11 months ago
2006
ACM
Correctness is a paramount attribute of any microprocessor design; however, without novel technologies to tame the increasing complexity of design verification, the amount of bugs...
ICCAD
2004
IEEE
15 years 6 months ago
2004
IEEE
Thermal effects are becoming a limiting factor in highperformance circuit design due to the strong temperaturedependence of leakage power, circuit performance, IC package cost and...
SRDS
2007
IEEE
15 years 4 months ago
2007
IEEE
The reliability of a large-scale storage system is influenced by a complex set of inter-dependent factors. This paper presents a comprehensive and extensible analytical framework ...
DATE
2010
IEEE
15 years 3 months ago
2010
IEEE
Abstract—Negative bias temperature instability (NBTI) significantly affects nanoscale integrated circuit performance and reliability. The degradation in threshold voltage (Vth) d...