10533 search results - page 131 / 2107 » Design in reliability for communication designs |
VLSID
2006
IEEE
15 years 4 months ago
2006
IEEE
This tutorial present the key aspects of design challenges and its solutions that are being experienced in VLSI design in the era of nano technology. The focus will be on design c...
ASAP
2005
IEEE
15 years 3 months ago
2005
IEEE
As billion transistor System-on-chips (SoC) become commonplace and design complexity continues to increase, designers are faced with the daunting task of meeting escalating design...
IWCMC
2006
ACM
15 years 4 months ago
2006
ACM
Unlike non-time-critical applications like email and file transfer, network games demand timely data delivery to maintain the seemingly interactive presence of players in the vir...
IPPS
2010
IEEE
14 years 7 months ago
2010
IEEE
Abstract--Clusters featuring the InfiniBand interconnect are continuing to scale. As an example, the "Ranger" system at the Texas Advanced Computing Center (TACC) include...
ISQED
2005
IEEE
15 years 3 months ago
2005
IEEE
As technology feature size is reduced, ESD becomes one of the dominant failure modes due to the lower gate oxide breakdown voltage. Also, the holding voltage of LVTSCR devices is ...