10533 search results - page 142 / 2107 » Design in reliability for communication designs |
DAC
2012
ACM
13 years 15 days ago
2012
ACM
Many state-of-the-art approaches on fault-tolerant system design make the simplifying assumption that all faults are detected within a certain time interval. However, based on a d...
ICCAD
2001
IEEE
15 years 7 months ago
2001
IEEE
In deep submicron VLSI circuits, interconnect reliability due to electromigration and thermal effects is fast becoming a serious design issue particularly for long signal lines. T...
IWSSD
2000
IEEE
15 years 2 months ago
2000
IEEE
In this study we focus on the specification and assessment of Stochastic Petri net (SPN) models to evaluate the design of an embedded system for reliability and availability. The ...
ISLPED
2005
ACM
15 years 3 months ago
2005
ACM
Due to difficulties in distributing a single global clock signal over increasingly large chip areas, a globally asynchronous, locally synchronous design is considered a promising ...
ASPLOS
2010
ACM
15 years 5 months ago
2010
ACM
DRAM is facing severe scalability challenges in sub-45nm technology nodes due to precise charge placement and sensing hurdles in deep-submicron geometries. Resistive memories, suc...