10533 search results - page 176 / 2107 » Design in reliability for communication designs |
ISLPED
2009
ACM
15 years 4 months ago
2009
ACM
The theoretical lower limit of subthreshold swing in MOSFETs (60 mV/decade) significantly restricts low voltage operation since it results in a low ON to OFF current ratio at low ...
DATE
2006
IEEE
15 years 4 months ago
2006
IEEE
Ever-increasing integrated circuit (IC) power densities and peak temperatures threaten reliability, performance, and economical cooling. To address these challenges, thermal analy...
BMCBI
2010
14 years 10 months ago
2010
Background: Polymerase chain reaction with confronting two-pair primers (PCR-CTPP) method produces allelespecific DNA bands of different lengths by adding four designed primers an...
DATE
2010
IEEE
15 years 3 months ago
2010
IEEE
— In this paper, we examine the impact of application task mapping on the reliability of MPSoC in the presence of single-event upsets (SEUs). We propose a novel soft erroraware d...
IOLTS
2005
IEEE
15 years 3 months ago
2005
IEEE
— In this paper, an innovative self-checking Reed Solomon encoder architecture is described. The presented architecture exploits some properties of the arithmetic operations in G...