10533 search results - page 84 / 2107 » Design in reliability for communication designs |
ISLPED
2007
ACM
14 years 11 months ago
2007
ACM
Negative bias temperature instability (NBTI) has become a dominant reliability concern for nanoscale PMOS transistors. In this paper, we propose variable-latency adder (VL-adder) ...
SBCCI
2003
ACM
15 years 3 months ago
2003
ACM
As we scale down to deep submicron (DSM) technology, noise is becoming a metric of equal importance as power, speed, and area. Smaller feature sizes, low voltage, and high frequen...
ISQED
2008
IEEE
15 years 4 months ago
2008
IEEE
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
ICCAD
2007
IEEE
15 years 6 months ago
2007
IEEE
While circuit density and power efficiency increase with each major advance in IC technology, reliability with respect to soft errors tends to decrease. Current solutions to this...
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WWW
2003
ACM
15 years 3 months ago
2003
ACM
An important factor in the successful deployment of federated web-services-based business activities will be the ability to guarantee reliable distributed operation and execution....