4542 search results - page 168 / 909 » Design patterns for data structures |
136
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GLVLSI
2006
IEEE
15 years 11 months ago
2006
IEEE
Process variations have become a serious concern for nanometer technologies. The interconnect and device variations include interand intra-die variations of geometries, as well as...
154
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DAC
2010
ACM
15 years 8 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
130
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MM
2010
ACM
15 years 5 months ago
2010
ACM
Image classification is a well-studied and hard problem in computer vision. We extend a proven solution for classifying web spam to handle images. We exploit the link structure of...
147
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ICDIM
2007
IEEE
15 years 11 months ago
2007
IEEE
Learning classifiers has been studied extensively the last two decades. Recently, various approaches based on patterns (e.g., association rules) that hold within labeled data hav...
139
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ICPR
2004
IEEE
16 years 6 months ago
2004
IEEE
The prediction of protein secondary structure is a classical problem in bioinformatics, and in the past few years several machine learning techniques have been proposed to t. From...