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BPM
2003
Springer
121views Business» more  BPM 2003»
15 years 9 months ago
Pattern Based Workflow Design Using Reference Nets
Daniel Moldt, Heiko Rölke
ATS
2000
IEEE
86views Hardware» more  ATS 2000»
15 years 8 months ago
An adjacency-based test pattern generator for low power BIST design
Patrick Girard, Loïs Guiller, Christian Landr...
ITC
2000
IEEE
53views Hardware» more  ITC 2000»
15 years 8 months ago
Using on-chip test pattern compression for full scan SoC designs
Helmut Lang, Jens Pfeiffer, Jeff Maguire