2918 search results - page 231 / 584 » Design tools for reliability analysis |
135
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DAC
2003
ACM
16 years 6 months ago
2003
ACM
With the scaling of technology, power grid noise is becoming increasingly significant for circuit performance. A typical power grid circuit contains millions of linear elements, m...
131
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ICCAD
2003
IEEE
16 years 1 months ago
2003
IEEE
Ultra-deep submicron manufacturability impacts physical design (PD) through complex layout rules and large guardbands for process variability; this creates new requirements for ne...
136
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DAC
2007
ACM
15 years 9 months ago
2007
ACM
This paper presents a statistical framework to cooperatively design and develop technology, product circuit, benchmarking and model early in the development stage. The statistical...
199
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ISLPED
2010
ACM
15 years 5 months ago
2010
ACM
The unique and unpredictable nature of silicon enables the use of physical unclonable functions (PUFs) for chip identification and authentication. Since the function of PUFs depen...
166
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BMCBI
2010
15 years 5 months ago
2010
Background: MicroRNAs (miRNAs) are a class of important gene regulators. The number of identified miRNAs has been increasing dramatically in recent years. An emerging major challe...