2918 search results - page 257 / 584 » Design tools for reliability analysis |
164
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DSN
2006
IEEE
16 years 2 days ago
2006
IEEE
The advent of deep sub-micron technology has exacerbated reliability issues in on-chip interconnects. In particular, single event upsets, such as soft errors, and hard faults are ...
155
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ICDCS
2006
IEEE
16 years 2 days ago
2006
IEEE
Publish/Subscribe systems provide a useful platform for delivering data (events) from publishers to subscribers in an anonymous fashion in distributed networks. In this paper, we ...
173
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GLVLSI
2005
IEEE
15 years 11 months ago
2005
IEEE
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
165
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ASPDAC
2008
ACM
15 years 8 months ago
2008
ACM
In modern circuit design, it is difficult to provide reliable parametric yield prediction since the real distribution of process data is hard to measure. Most existing approaches ...
157
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ICSE
2010
IEEE-ACM
15 years 10 months ago
2010
IEEE-ACM
Concurrency is inherent in today’s software. Unexpected interactions between concurrently executing threads often cause subtle bugs in concurrent programs. Such bugs are hard to...