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HPDC
2009
IEEE
15 years 6 months ago
2009
IEEE
This paper explores the feasibility of a cost-efficient storage architecture that offers the reliability and access performance characteristics of a high-end system. This architec...
ICCAD
2006
IEEE
15 years 8 months ago
2006
IEEE
Abstract— Chip-package thermal analysis is necessary for the design and synthesis of reliable, high-performance, low-power, compact integrated circuits (ICs). Many methods of IC ...
DAC
2007
ACM
16 years 27 days ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
SAC
2009
ACM
15 years 6 months ago
2009
ACM
In this paper we propose a passive conformance testing technique applied to a Mobile ad hoc network (MANET) routing protocol, OLSR, that is characterized by a dynamically changing...
APL
1998
ACM
15 years 4 months ago
1998
ACM
This article describes our experience with test suites and automated branch coverage tools for APL software maintenance, based on our use of them to verify Y2K compliance of an AP...