Given the decreasing cost of non-volatile RAM (NVRAM), by the late 1990's it will be feasible for most workstations to include a megabyte or more of NVRAM, enabling the desig...
Mary Baker, Satoshi Asami, Etienne Deprit, John K....
The negative effect of electromigration on signal and power line lifetime and functional reliability is an increasingly important problem for the physical design of integrated cir...
Continuous transistor scaling due to improvements in CMOS devices and manufacturing technologies is increasing processor power densities and temperatures; thus, creating challenges...
David Atienza, Giovanni De Micheli, Luca Benini, J...
Software development is rarely an individual effort and generally involves teams of developers collaborating to generate good reliable code. Among the software code there exist te...
A large part of safety-critical embedded systems has to satisfy hard real-time constraints. These need sound methods and tools to derive reliable run-time guarantees. The guarante...