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ISQED
2011
IEEE
398views Hardware» more  ISQED 2011»
14 years 1 months ago
Switching constraint-driven thermal and reliability analysis of Nanometer designs
As process technology continues to shrink, interconnect current densities continue to increase, making it ever more difficult to meet chip reliability targets. For microprocessors...
Srini Krishnamoorthy, Vishak Venkatraman, Yuri Apa...
ITC
1999
IEEE
98views Hardware» more  ITC 1999»
15 years 1 months ago
A design diversity metric and reliability analysis for redundant systems
Design diversity has long been used to protect redundant systems against common-mode failures. The conventional notion of diversity relies on "independent" generation of...
Subhasish Mitra, Nirmal R. Saxena, Edward J. McClu...
DAC
1998
ACM
15 years 10 months ago
Design Reliability - Estimation through Statistical Analysis of Bug Discovery Data
Statistical analysis of bug discovery data is used in the software industry to check the quality of the testing process and estimate the reliability of the tested program. In this...
Yossi Malka, Avi Ziv
DSN
2005
IEEE
15 years 3 months ago
Design Time Reliability Analysis of Distributed Fault Tolerance Algorithms
Designing a distributed fault tolerance algorithm requires careful analysis of both fault models and diagnosis strategies. A system will fail if there are too many active faults, ...
Elizabeth Latronico, Philip Koopman
DAC
2006
ACM
15 years 3 months ago
Practical aspects of reliability analysis for IC designs
T. Pompl, C. Schlünder, M. Hommel, H. Nielen,...