3007 search results - page 516 / 602 » Designed -in-diagnostics: A new optical method |
CHES
2009
Springer
15 years 10 months ago
2009
Springer
Abstract. The general trend in semiconductor industry to separate design from fabrication leads to potential threats from untrusted integrated circuit foundries. In particular, mal...
OSDI
2002
ACM
15 years 10 months ago
2002
ACM
Three experimental environments traditionally support network and distributed systems research: network emulators, network simulators, and live networks. The continued use of mult...
DCC
2004
IEEE
15 years 9 months ago
2004
IEEE
It is well-known that wavelet transforms provide sparse decompositions over many types of image regions but not over image singularities/edges that manifest themselves along curve...
ICCD
2006
IEEE
15 years 6 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
ICCD
2000
IEEE
15 years 6 months ago
2000
IEEE
This paper presents a new method to extract functionally equivalent structures from logic netlists. It uses a fast functional regularity extraction algorithm based on structural e...