Abstract-- Increasing delay and power variation are significant challenges to the designers as technology scales to the deep sub-micron (DSM) regime. Traditional module selection t...
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...
This paper addresses the problem of automatic generation of implementation software from high-level functional specifications in the context of embedded system on chip designs. So...
It is generally believed that quadratic discriminant analysis (QDA) can better fit the data in practical pattern recognition applications compared to linear discriminant analysis ...
Jie Wang, Konstantinos N. Plataniotis, Juwei Lu, A...
A novel approach is presented to efficiently render local subsurface scattering effects. We introduce an importance sampling scheme for a practical subsurface scattering model. It...
Tom Mertens, Jan Kautz, Philippe Bekaert, Frank Va...