54 search results - page 3 / 11 » Designing Leakage Aware Multipliers |
ISQED
2010
IEEE
14 years 1 months ago
2010
IEEE
Abstract— As the semiconductor technology continues its marching toward the deep sub-micron domain, the strong relation between leakage current and temperature becomes critical i...
TCAD
2008
13 years 6 months ago
2008
As CMOS technology is scaled down toward the nanoscale regime, drastically growing leakage currents and variations in device characteristics are becoming two important design chall...
DAC
2004
ACM
14 years 7 months ago
2004
ACM
Electrothermal couplings between supply voltage, operating frequency, power dissipation and die temperature have been shown to significantly impact the energy-delay-product (EDP) ...
ISLPED
2006
ACM
14 years 5 days ago
2006
ACM
In a few technology generations, limitations of fabrication processes will make accurate design time power estimates a daunting challenge. Static leakage current which comprises a...
ISLPED
2005
ACM
13 years 11 months ago
2005
ACM
Temperature is becoming a first rate design criterion in ASICs due to its negative impact on leakage power, reliability, performance, and packaging cost. Incorporating awareness o...