50 search results - page 9 / 10 » Designing Masking Fault-Tolerance via Nonmasking Fault-Toler... |
ASPLOS
2006
ACM
14 years 14 days ago
2006
ACM
Concurrency bugs are among the most difficult to test and diagnose of all software bugs. The multicore technology trend worsens this problem. Most previous concurrency bug detect...
ICDCS
2002
IEEE
13 years 11 months ago
2002
IEEE
An Operational Information System (OIS) supports a real-time view of an organization’s information critical to its logistical business operations. A central component of an OIS ...
DAC
2005
ACM
14 years 7 months ago
2005
ACM
As Si CMOS devices are scaled down into the nanoscale regime, current computer architecture approaches are reaching their practical limits. Future nano-architectures will confront...
DATE
2010
IEEE
13 years 11 months ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
SOSP
2007
ACM
14 years 3 months ago
2007
ACM
This paper describes the design, implementation, and evaluation of a replication scheme to handle Byzantine faults in transaction processing database systems. The scheme compares ...