124 search results - page 6 / 25 » Designing Reliable Digital Molecular Electronic Circuits |
117
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DAC
2007
ACM
16 years 2 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
101
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DAC
1994
ACM
15 years 5 months ago
1994
ACM
Higher levels of integration have led to a generation of integrated circuits for which power dissipation and reliability are major design concerns. In CMOS circuits, both of these ...
118
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DAC
2007
ACM
16 years 2 months ago
2007
ACM
Minimizing power consumption is vitally important in embedded system design; power consumption determines battery lifespan. Ultralow-power designs may even permit embedded systems...
111
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CL
2000
Springer
15 years 6 months ago
2000
Springer
A number of diagnostic and optimisation problems in Electronics Computer Aided Design have usually been handled either by specific tools or by mapping them into a general problem s...