As CMOS technology scales and more transistors are packed on to the same chip, soft error reliability has become an increasingly important design issue for processors. Prior resea...
Xiaodong Li, Sarita V. Adve, Pradip Bose, Jude A. ...
Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...
High-level formalisms such as stochastic Petri nets can be used to model complex systems. Analysis of logical and numerical properties of these models often requires the generatio...
Gianfranco Ciardo, Joshua Gluckman, David M. Nicol
The aim of this paper is to introduce LinCAN, a CAN driver system for Linux, developed at the Department of Control Engineering of the Czech Technical University in Prague, and to ...
Michal Sojka, Pavel Pisa, Martin Petera, Ondrej Sp...
Increasing power densities and the high cost of low thermal resistance packages and cooling solutions make it impractical to design processors for worst-case temperature scenarios...
Thidapat Chantem, Xiaobo Sharon Hu, Robert P. Dick