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106
Voted
DATE
2005
IEEE
15 years 9 months ago
2005
IEEE
Multi-site testing is a popular and effective way to increase test throughput and reduce test costs. We present a test throughput model, in which we focus on wafer testing, and co...
ASPDAC
2006
ACM
15 years 9 months ago
2006
ACM
— We have designed and implemented the LDPC decoder chip with memory-reduction method to achieve high-throughput and practical chip size. The decoder decodes (3,6)-2304bit regula...
110
Voted
CEC
2009
IEEE
15 years 7 months ago
2009
IEEE
This paper presents a new unified design flow developed within the Perplexus project that aims to accelerate parallelizable data-intensive applications in the context of ubiquitous...
110
Voted
AI
2007
Springer
15 years 7 months ago
2007
Springer
We have constructed a poker classification system which makes informed betting decisions based upon three defining features extracted while playing poker: hand value, risk, and agg...