Nanometer circuits are highly susceptible to soft errors generated by alpha-particle or atmospheric neutron strikes to circuit nodes. The reasons for the high susceptibility are t...
In this paper, a new paradigm for designing logic circuits with concurrent error detection (CED) is described. The key idea is to exploit the asymmetric soft error susceptibility ...
: Models of the association between input accuracy and output accuracy imply that, for any given application, the effect of input errors on the output error rate generally varies i...
We propose a framework that allows dual-layer cooperative error control in a nanoscale network-on-chip (NoC), to simultaneously improve reliability, performance and energy efficie...
Abstract. This paper discusses various classifications of component interoperability errors.These classifications aim at supporting the automation of component adaptation. The us...