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ISQED
2009
IEEE
15 years 4 months ago
2009
IEEE
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
APCSAC
2004
IEEE
15 years 1 months ago
2004
IEEE
As device sizes continue shrinking, lower charges are needed to activate gates, and consequently ever smaller external events (such as single ionizing particles of naturally occurr...
FDTC
2006
Springer
15 years 1 months ago
2006
Springer
We present a scheme for robust multi-precision arithmetic over the positive integers, protected by a novel family of non-linear arithmetic residue codes. These codes have a very hi...
TIFS
2008
14 years 10 months ago
2008
Abstract--Statistical pattern recognition techniques have recently been shown to provide a finer balance between misdetections and false alarms than the more conventional intrusion...
EDCC
1994
Springer
15 years 2 months ago
1994
Springer
This paper discusses the problems of pin-level fault injection for dependability validation and presents the architecture of a pin-level fault injector called RIFLE. This system ca...