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VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
15 years 12 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
KBSE
2005
IEEE
15 years 5 months ago
Automated test generation for engineering applications
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
Songtao Xia, Ben Di Vito, César Muño...
DRM
2003
Springer
15 years 4 months ago
Constructing a virtual primary key for fingerprinting relational data
Agrawal and Kiernan’s watermarking technique for database relations [1] and Li et al’s fingerprinting extension [6] both depend critically on primary key attributes. Hence, t...
Yingjiu Li, Vipin Swarup, Sushil Jajodia
CSDA
2007
136views more  CSDA 2007»
14 years 11 months ago
A note on iterative marginal optimization: a simple algorithm for maximum rank correlation estimation
The maximum rank correlation (MRC) estimator was originally studied by Han [1987. Nonparametric analysis of a generalized regression model. J. Econometrics 35, 303–316] and Sher...
Hansheng Wang
115
Voted
BMCBI
2005
121views more  BMCBI 2005»
14 years 11 months ago
Comparison of seven methods for producing Affymetrix expression scores based on False Discovery Rates in disease profiling data
Background: A critical step in processing oligonucleotide microarray data is combining the information in multiple probes to produce a single number that best captures the express...
Kerby Shedden, Wei Chen, Rork Kuick, Debashis Ghos...