57 search results - page 8 / 12 » Detecting Patterns and OLAP Operations in the GOLD Model |
ITC
2000
IEEE
15 years 1 months ago
2000
IEEE
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
DAC
2006
ACM
15 years 10 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
SACMAT
2006
ACM
15 years 3 months ago
2006
ACM
In this paper we propose an access control model for the Resource Description Framework (RDF). We argue that existing access control models, like the ones developed for securing e...
CCS
2009
ACM
15 years 4 months ago
2009
ACM
Large-scale distributed systems have dense, complex code-bases that are assumed to perform multiple and inter-dependent tasks while user interaction is present. The way users inte...
80
Voted
VTS
2008
IEEE
15 years 3 months ago
2008
IEEE
With increasing IC process variation and increased operating speed, it is more likely that even subtle defects will lead to the malfunctioning of a circuit. Various fault models, ...