Studies of the fault-tolerance of graphs have tended to largely concentrate on classical graph connectivity. This measure is very basic, and conveys very little information for des...
Vijay Lakamraju, Zahava Koren, Israel Koren, C. Ma...
This paper describes the design and evaluation of a robust integrator for software-implemented control systems. The integrator is constructed as a generic component in the Simulin...
Supermarkets lose millions of pounds every year through lost trading and stock wastage caused by the failure of refrigerated cabinets. Therefore, a huge commercial market exists fo...
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Technology scaling, characterized by decreasing feature size, thinning gate oxide, and non-ideal voltage scaling, will become a major hindrance to microprocessor reliability in fu...
Jason A. Blome, Shuguang Feng, Shantanu Gupta, Sco...