6329 search results - page 1211 / 1266 » Detection of Stochastic Processes |
150
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VLSID
2001
IEEE
16 years 4 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
158
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HPCA
2006
IEEE
16 years 4 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
158
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CHI
2001
ACM
16 years 4 months ago
2001
ACM
While predictions abound that electronic books will supplant traditional paper-based books, many people bemoan the coming loss of the book as cultural artifact. In this project we...
140
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OSDI
2004
ACM
16 years 4 months ago
2004
ACM
We present a new technique, failure-oblivious computing, that enables servers to execute through memory errors without memory corruption. Our safe compiler for C inserts checks th...
207
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SIGMOD
2007
ACM
16 years 4 months ago
2007
ACM
Optimizing SQL subqueries has been an active area in database research and the database industry throughout the last decades. Previous work has already identified some approaches ...