BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
We present the application of a deterministic logic BIST scheme on state-of-the-art industrial circuits. Experimental results show that complete fault coverage can be achieved for...
Gundolf Kiefer, Hans-Joachim Wunderlich, Harald P....
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...
Peter Wohl, John A. Waicukauski, Sanjay Patel, Min...
In mixed-mode BIST, deterministic test patterns are generated with on-chip hardware to detect the random-pattern-resistant (r.p.r.) faults that are missed by the pseudo-random pat...
Madhavi Karkala, Nur A. Touba, Hans-Joachim Wunder...
- Extension of a BIST design algorithm is proposed in this paper. The method is based on a synthesis of a combinational block - the decoder, transforming pseudo-random code words i...