5171 search results - page 444 / 1035 » Deterministic Parallel Processing |
120
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ATS
2005
IEEE
15 years 9 months ago
2005
IEEE
— Structural transformation of a design to enhance its testability while satisfying design constraints on power and performance, can result in improved test cost and test confid...
152
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GLVLSI
2005
IEEE
15 years 9 months ago
2005
IEEE
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
93
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ISCAS
2005
IEEE
15 years 9 months ago
2005
IEEE
—A novel clock and data recovery architecture with adaptive loop gain is proposed for spread spectrum SerDes applications such as the Serial AT Attachment. The proposed design co...
137
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WIOPT
2005
IEEE
15 years 9 months ago
2005
IEEE
In this paper we consider the problem of searching for a node or an object (i.e., piece of data, file, etc.) in a large wireless network. We consider the class of controlled flo...
134
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ICDM
2003
IEEE
15 years 9 months ago
2003
IEEE
Clustering is the process of grouping a set of objects into classes of similar objects. Because of unknownness of the hidden patterns in the data sets, the definition of similari...