115 search results - page 10 / 23 » Deterministic Test Pattern Generation Techniques for Sequent... |
79
Voted
DAC
1995
ACM
15 years 1 months ago
1995
ACM
Abstract A new method for power estimation in sequential circuits is presented that is based on a statistical estimation technique. By applying randomly generated input sequences t...
74
Voted
DFT
1997
IEEE
15 years 1 months ago
1997
IEEE
The paper presents a test pattern generation and fault simulation methodology for the detection of catastrophic faults in analogue circuits. The test methodology chosen for evalua...
71
Voted
DSD
2007
IEEE
15 years 3 months ago
2007
IEEE
Similar to sequential test pattern generation, the problem of identifying untestable faults in sequential circuits remains unsolved. Most of the previous works in untestability id...
DATE
2000
IEEE
15 years 1 months ago
2000
IEEE
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
86
Voted
VLSID
2009
IEEE
15 years 10 months ago
2009
IEEE
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...