115 search results - page 19 / 23 » Deterministic Test Pattern Generation Techniques for Sequent... |
ICES
2000
Springer
15 years 1 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
GLVLSI
2005
IEEE
15 years 3 months ago
2005
IEEE
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
AAAI
2008
14 years 12 months ago
2008
Model-Based Diagnosis (MBD) typically focuses on diagnoses, minimal under some minimality criterion, e.g., the minimal-cardinality set of faulty components that explain an observa...
DAC
2000
ACM
15 years 10 months ago
2000
ACM
In this paper we describe an area efficient power minimization scheme "Control Generated ClockingI` that saves significant amounts of power in datapath registers and clock dr...
DATE
2006
IEEE
15 years 3 months ago
2006
IEEE
In this paper, we propose a new circuit transformation technique in conjunction with the use of a special diagnostic test pattern, named SO-SLAT pattern, to achieve higher multipl...