115 search results - page 21 / 23 » Deterministic Test Pattern Generation Techniques for Sequent... |
101
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DAC
2000
ACM
16 years 17 days ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
122
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DATE
1999
IEEE
15 years 3 months ago
1999
IEEE
Boolean Satisfiability is a ubiquitous modeling tool in Electronic Design Automation, It finds application in test pattern generation, delay-fault testing, combinational equivalen...
EURODAC
1994
IEEE
15 years 3 months ago
1994
IEEE
Symbolic state space exploration techniques for Finite State Machines (FSMs) are a major recent result in CAD for VLSI. Most of them are exact and based on forward traversal, but ...
ITC
2003
IEEE
15 years 4 months ago
2003
IEEE
: The paper presents a novel technique for generating effective vectors for delay defects. The test set achieves high path delay fault coverage to capture smalldistributed delay de...
ATS
2009
IEEE
15 years 6 months ago
2009
IEEE
SAT-based automatic test pattern generation has several advantages compared to conventional structural procedures, yet often yields too large test sets. We present a dynamic compa...