115 search results - page 3 / 23 » Deterministic Test Pattern Generation Techniques for Sequent... |
DAC
1999
ACM
15 years 10 months ago
1999
ACM
TCAD
1998
14 years 9 months ago
1998
—We study the effect of the controller on the testability of sequential circuits composed of controllers and data paths. We show that even when all the loops of the circuit have ...
103
click to vote
ISCAS
2007
IEEE
15 years 3 months ago
2007
IEEE
Due to the development of high speed circuits beyond the 2-GHz mark, the significance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in t...
DATE
1998
IEEE
15 years 1 months ago
1998
IEEE
A new approach for sequential circuit test generation is proposed that combines software testing based techniques at the high level with test enhancement techniques at the gate le...
74
Voted
VTS
1998
IEEE
15 years 1 months ago
1998
IEEE
This paper proposes an ATPG technique that reduces power dissipation during the test of sequential circuits. The proposed approach exploits some redundancy introduced during the t...