115 search results - page 5 / 23 » Deterministic Test Pattern Generation Techniques for Sequent... |
ETS
2009
IEEE
14 years 7 months ago
2009
IEEE
Structural on-line self-test may be performed to detect permanent faults and avoid their accumulation. This paper improves concurrent BIST techniques based on a deterministic test ...
ETS
2006
IEEE
15 years 3 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
ICCAD
1994
IEEE
15 years 1 months ago
1994
IEEE
This paper presents a new method of selecting scan
ipops (FFs) in partial scan designs of sequential circuits. Scan FFs are chosen so that the whole circuit can be partitioned in...
TC
2008
14 years 9 months ago
2008
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
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ITC
1993
IEEE
15 years 1 months ago
1993
IEEE
ÐPseudoexhaustive testing of a combinational circuit involves applying all possible input patterns to all its individual output cones. The testing ensures detection of all detecta...