4 search results - page 1 / 1 » Deterministic partitioning techniques for fault diagnosis in... |
ITC
2000
IEEE
15 years 1 months ago
2000
IEEE
A deterministic partitioning technique for fault diagnosis in Scan-Based BIST is proposed. Properties of high quality partitions for improved fault diagnosis times are identified...
ITC
1997
IEEE
15 years 1 months ago
1997
IEEE
A deterministic-partitioning technique and an improved analysis scheme for fault diagnosis in Scan-Based BIST is proposed. The incorporation of the superposition principle to the ...
DT
2002
14 years 9 months ago
2002
GLVLSI
2005
IEEE
15 years 3 months ago
2005
IEEE
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...