We consider a two-tiered Wireless Sensor Network (WSN) consisting of sensor clusters deployed around strategic locations and base-stations (BSs) whose locations are relatively fl...
Jianping Pan, Yiwei Thomas Hou, Lin Cai, Yi Shi, S...
Semiconductor transient faults (i.e. soft errors) have become an increasingly important threat to microprocessor reliability. Simultaneous multithreaded (SMT) architectures exploi...
The Aspect Integrator Platform (AIP) from ABB was designed to build the next generation of industrial automation applications. This platform is part of a set of products that prov...
Apply is a Domain-Specific Language for image processing and low-level computer vision. Apply allows programmers to write kernel operations that focus on the computation for a sin...
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
Kypros Constantinides, Stephen Plaza, Jason A. Blo...