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» Device and Technology Challenges for Nanoscale CMOS
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ASPDAC
2008
ACM
103views Hardware» more  ASPDAC 2008»
13 years 8 months ago
Reliability-aware design for nanometer-scale devices
Continuous transistor scaling due to improvements in CMOS devices and manufacturing technologies is increasing processor power densities and temperatures; thus, creating challenges...
David Atienza, Giovanni De Micheli, Luca Benini, J...
GLOBECOM
2009
IEEE
13 years 10 months ago
On-Chip Integrated Antenna Structures in CMOS for 60 GHz WPAN Systems
Abstract--This paper presents several on-chip antenna structures that may be fabricated with standard CMOS technology for use at millimeter wave frequencies. On-chip antennas for w...
Felix Gutierrez Jr., Kristen Parrish, Theodore S. ...
DAC
2011
ACM
12 years 6 months ago
Rethinking memory redundancy: optimal bit cell repair for maximum-information storage
SRAM design has been a major challenge for nanoscale manufacturing technology. We propose a new bit cell repair scheme for designing maximum-information memory system (MIMS). Unli...
Xin Li
GLVLSI
2010
IEEE
310views VLSI» more  GLVLSI 2010»
13 years 11 months ago
Graphene tunneling FET and its applications in low-power circuit design
Graphene nanoribbon tunneling FETs (GNR TFETs) are promising devices for post-CMOS low-power applications because of the low subthreshold swing, high Ion/Ioff, and potential for l...
Xuebei Yang, Jyotsna Chauhan, Jing Guo, Kartik Moh...
DAC
2008
ACM
14 years 7 months ago
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao