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101
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ASPDAC
2011
ACM
173views Hardware» more  ASPDAC 2011»
14 years 5 months ago
Device-parameter estimation with on-chip variation sensors considering random variability
Kenichi Shinkai, Masanori Hashimoto
125
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IPSN
2004
Springer
15 years 6 months ago
Estimation from lossy sensor data: jump linear modeling and Kalman filtering
Due to constraints in cost, power, and communication, losses often arise in large sensor networks. The sensor can be modeled as an output of a linear stochastic system with random...
Alyson K. Fletcher, Sundeep Rangan, Vivek K. Goyal