93 search results - page 1 / 19 » Diagnosis of Delay Defects Using Statistical Timing Models |
VTS
2003
IEEE
15 years 2 months ago
2003
IEEE
— In this paper, we study the problem of delay defect diagnosis based on statistical timing models. We propose a diagnosis algorithm that can effectively utilize statistical timi...
DATE
2003
IEEE
15 years 2 months ago
2003
IEEE
Abstract — This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models. We illustrate the differences between the delay defect d...
ITC
2003
IEEE
15 years 2 months ago
2003
IEEE
In this paper, we study the possibility of using logic defect-level prediction models to predict the detection behavior of statistical timing defects. We compare two known logic m...
ITC
2003
IEEE
15 years 2 months ago
2003
IEEE
This paper describes a new post-silicon validation problem for diagnosing systematic timing errors. We illustrate the differences between timing validation and the traditional log...
DATE
2009
IEEE
15 years 4 months ago
2009
IEEE
In this paper, a novel diagnosis method is proposed. The proposed technique uses machine learning techniques instead of traditional cause-effect and/or effect-cause analysis. The ...