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116
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DFT
2002
IEEE
15 years 9 months ago
2002
IEEE
IDDQ test loses its effectiveness for deep sub-micron chips since it cannot distinguish between faulty and fault-free currents. The concept of current ratios, in which the ratio o...
141
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NIPS
2003
15 years 5 months ago
2003
We present a geometric approach to statistical shape analysis of closed curves in images. The basic idea is to specify a space of closed curves satisfying given constraints, and e...
144
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HCI
2009
15 years 1 months ago
2009
In this paper we present an accessibility analysis framework for the specification of Web accessibility evaluation scenarios that differentiates the requirements of users with disa...
135
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STVR
2002
15 years 3 months ago
2002
Test-suite reduction techniques attempt to reduce the costs of saving and reusing test cases during software maintenance by eliminating redundant test cases from test suites. A po...
107
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OOPSLA
2007
Springer
15 years 10 months ago
2007
Springer
One recent change in software development is developers starting to take responsibility for the quality of their work by writing and executing automated tests. As with any new act...