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SIGSOFT
2007
ACM
16 years 5 months ago
A study of interleaving coverage criteria
Concurrency bugs are becoming increasingly important due to the prevalence of concurrent programs. A fundamental problem of concurrent program bug detection and testing is that th...
Shan Lu, Weihang Jiang, Yuanyuan Zhou
158
Voted
DATE
2009
IEEE
115views Hardware» more  DATE 2009»
15 years 11 months ago
Automated data analysis solutions to silicon debug
Since pre-silicon functional verification is insufficient to detect all design errors, re-spins are often needed due to malfunctions that escape into the silicon. This paper pre...
Yu-Shen Yang, Nicola Nicolici, Andreas G. Veneris
KBSE
2002
IEEE
15 years 10 months ago
What Makes Finite-State Models More (or Less) Testable?
Finite-state machine (FSM) models are commonly used to represent software with concurrent processes. Established model checking tools can be used to automatically test FSM models,...
David Owen, Tim Menzies, Bojan Cukic
154
Voted
ICSE
2010
IEEE-ACM
15 years 9 months ago
An eclectic approach for change impact analysis
Change impact analysis aims at identifying software artifacts being affected by a change. In the past, this problem has been addressed by approaches relying on static, dynamic, a...
Michele Ceccarelli, Luigi Cerulo, Gerardo Canfora,...
235
Voted
REFSQ
2010
Springer
15 years 2 months ago
Challenges in Aligning Requirements Engineering and Verification in a Large-Scale Industrial Context
[Context and motivation] When developing software, coordination between different organizational units is essential in order to develop a good quality product, on time and within b...
Giedre Sabaliauskaite, Annabella Loconsole, Emelie...