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VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
16 years 2 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
NAACL
2003
15 years 3 months ago
Semantic Language Models for Topic Detection and Tracking
In this work, we present a new semantic language modeling approach to model news stories in the Topic Detection and Tracking (TDT) task. In the new approach, we build a unigram la...
Ramesh Nallapati
NDSS
2005
IEEE
15 years 7 months ago
One-Way Isolation: An Effective Approach for Realizing Safe Execution Environments
In this paper, we present an approach for realizing a safe execution environment (SEE) that enables users to “try out” new software (or configuration changes to existing soft...
Weiqing Sun, Zhenkai Liang, V. N. Venkatakrishnan,...
NDSS
2008
IEEE
15 years 8 months ago
Automated Whitebox Fuzz Testing
Fuzz testing is an effective technique for finding security vulnerabilities in software. Traditionally, fuzz testing tools apply random mutations to well-formed inputs of a progr...
Patrice Godefroid, Michael Y. Levin, David A. Moln...
DFT
1997
IEEE
93views VLSI» more  DFT 1997»
15 years 5 months ago
An IDDQ Sensor for Concurrent Timing Error Detection
Abstract— Error control is a major concern in many computer systems, particularly those deployed in critical applications. Experience shows that most malfunctions during system o...
Christopher G. Knight, Adit D. Singh, Victor P. Ne...