787 search results - page 124 / 158 » Digital Algebra and Circuits |
121
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WCE
2007
15 years 1 months ago
2007
Improving testability during the early stages of High-level synthesis has several advantages including reduced test hardware overhead and design iterations. Recently, BIST techniq...
60
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IEICET
2008
15 years 15 days ago
2008
This paper studies impact of the well edge proximity effect on digital circuit delay, based on model parameters extracted from test structures in an industrial 65nm wafer process. ...
126
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INTEGRATION
2006
15 years 14 days ago
2006
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
96
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FTEDA
2007
15 years 13 days ago
2007
Field-Programmable Gate Arrays (FPGAs) have become one of the key digital circuit implementation media over the last decade. A crucial part of their creation lies in their archite...
77
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TCAD
1998
15 years 4 days ago
1998
—This paper introduces a novel optimization paradigm for increasing the throughput of digital systems. The basic idea consists of transforming fixed-latency units into variable-...