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ISCAS
2005
IEEE
131views Hardware» more  ISCAS 2005»
15 years 6 months ago
Timing yield estimation using statistical static timing analysis
—As process variations become a significant problem in deep sub-micron technology, a shift from deterministic static timing analysis to statistical static timing analysis for hig...
Min Pan, Chris C. N. Chu, Hai Zhou
108
Voted
ICIP
2009
IEEE
14 years 10 months ago
Shapes as empirical distributions
We address the problem of shape based classification. We interpret the shape of an object as a probability distribution governing the location of the points of the object. An imag...
Bernardo Rodrigues Pires, José M. F. Moura
79
Voted
ISCAS
2008
IEEE
112views Hardware» more  ISCAS 2008»
15 years 7 months ago
Glitch-aware output switching activity from word-level statistics
— This paper presents models for estimating the transition activity of signals at the output of adders in Field Programmable Gate Arrays (FPGAs), given only word-level measures o...
Jonathan A. Clarke, George A. Constantinides, Pete...
101
Voted
VLSID
2005
IEEE
150views VLSI» more  VLSID 2005»
16 years 1 months ago
Multivariate Normal Distribution Based Statistical Timing Analysis Using Global Projection and Local Expansion
This paper employs general multivariate normal distribution to develop a new efficient statistical timing analysis methodology. The paper presents the theoretical framework of the...
Baohua Wang, Pinaki Mazumder
113
Voted
ICSE
2005
IEEE-ACM
16 years 22 days ago
Use of relative code churn measures to predict system defect density
Software systems evolve over time due to changes in requirements, optimization of code, fixes for security and reliability bugs etc. Code churn, which measures the changes made to...
Nachiappan Nagappan, Thomas Ball