5012 search results - page 202 / 1003 » Distributed Error Correction |
179
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HPCA
2009
IEEE
16 years 1 months ago
2009
IEEE
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...
165
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BMCBI
2005
15 years 6 months ago
2005
Background: Many complex random networks have been found to be scale-free. Existing literature on scale-free networks has rarely considered potential false positive and false nega...
180
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CODES
2010
IEEE
15 years 3 months ago
2010
IEEE
This paper presents an approach to system-level optimization of error detection implementation in the context of fault-tolerant realtime distributed embedded systems used for safe...
180
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CASES
2009
ACM
16 years 28 days ago
2009
ACM
As technology scales and the energy of computation continually approaches thermal equilibrium [1,2], parameter variations and noise levels will lead to larger error rates at vario...
186
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IEEEPACT
2006
IEEE
16 years 14 days ago
2006
IEEE
With reducing feature size, increasing chip capacity, and increasing clock speed, microprocessors are becoming increasingly susceptible to transient (soft) errors. Redundant multi...