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CIKM
2008
Springer
14 years 11 months ago
Large-scale, parallel automatic patent annotation
When researching new product ideas or filing new patents, inventors need to retrieve all relevant pre-existing know-how and/or to exploit and enforce patents in their technologica...
Milan Agatonovic, Niraj Aswani, Kalina Bontcheva, ...
95
Voted
ACMSE
2006
ACM
14 years 11 months ago
Phoenix-based clone detection using suffix trees
A code clone represents a sequence of statements that are duplicated in multiple locations of a program. Clones often arise in source code as a result of multiple cut/paste operat...
Robert Tairas, Jeff Gray
ICCAD
2007
IEEE
119views Hardware» more  ICCAD 2007»
14 years 11 months ago
IntSim: A CAD tool for optimization of multilevel interconnect networks
– Interconnect issues are becoming increasingly important for ULSI systems. IntSim, an interconnect CAD tool, has been developed to obtain pitches of different wiring levels and ...
Deepak C. Sekar, Azad Naeemi, Reza Sarvari, Jeffre...
81
Voted
IMC
2007
ACM
14 years 11 months ago
On optimal probing for delay and loss measurement
Packet delay and loss are two fundamental measures of performance. Using active probing to measure delay and loss typically involves sending Poisson probes, on the basis of the PA...
François Baccelli, Sridhar Machiraju, Darry...
100
Voted
ISPD
2007
ACM
151views Hardware» more  ISPD 2007»
14 years 11 months ago
Pattern sensitive placement for manufacturability
When VLSI technology scales toward 45nm, the lithography wavelength stays at 193nm. This large gap results in strong refractive effects in lithography. Consequently, it is a huge...
Shiyan Hu, Jiang Hu