In this paper, we present a method for analyzing the leakage current, and hence the leakage power, of a circuit under process parameter variations that can include spatial correla...
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
Concurrent programs are notorious for containing errors that are difficult to reproduce and diagnose at run-time. This motivated the development of type systems that statically en...
Amit Sasturkar, Rahul Agarwal, Liqiang Wang, Scott...
Distributed estimation of an unknown signal is a common task in sensor networks. The scenario usually envisioned consists of several nodes, each making an observation correlated wi...